DCMPMS Seminars

Structural characterization of single-crystal ß-Ga2O3 using high-resolution x-ray diffraction

Name: Structural characterization of single-crystal ß-Ga2O3 using high-resolution x-ray diffraction
Start: 2022-08-26T18:30:00+05:30
End: 2022-08-26T19:30:00+05:30
Location: No location set

Friday 26 Aug 2022, 18:30 → 19:30 Asia/Kolkata

https://tifr-res-in.zoom.us/j/98241656349 Meeting ID: 982 4165 6349 Passcode: 464734

Structural characterization of single-crystal ß-Ga2O3 using high-resolution x-ray diffraction

by Mr Vishal Suriyanarayanan

https://tifr-res-in.zoom.us/j/98241656349 Meeting ID: 982 4165 6349 Passcode: 464734